The Thickness Dependence of Optical Constants of Ultrathin Iron Films

被引：0

作者：

高尚 ^{[1
]}

连洁 ^{[1
]}

孙肖芬 ^{[2
]}

王晓 ^{[1
]}

李萍 ^{[1
]}

李庆浩 ^{[3
]}

机构：

[1] Department of Optical Engineering,Shandong University

[2] Research Center of Laser Fusion,China Academy of Engineering Physics

[3] School of Physics and Microelectronics,Shandong

来源：

Chinese Physics Letters | 2013年 / 30卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O484.41 [];

学科分类号：

0803 ;

摘要：

Ultrathin iron films with different thicknesses from 7.1 to 51.7nm are deposited by magnetron sputtering and covered by tantalum layers protecting them from being oxidized.These ultrathin iron films are studied by spectroscopic ellipsometry and transmittance measurement.An extra tantalum film is deposited under the same sputtering conditions and its optical constants and film thickness are obtained by a combination of ellipsometry and transmission measurement.After introducing these obtained optical constants and film thickness into the tantalum-iron film,the optical constants and film thicknesses of ultrathin iron films with different thicknesses are obtained.The results show that combining ellipsometry and transmission measurement improves the uniqueness of the obtained film thickness.The optical constants of ultrathin iron films depend strongly on film thicknessesThere is a broad absorption peak at about 370nm and it shifts to 410nm with film thickness decreasing.

引用

页码：210 / 213

页数：4

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