Oxidation site of polycrystalline silicon surface studied using scanning force/tunneling microscope (AFM/STM) in air

被引:0
|
作者
机构
[1] Sugawara, Yasuhiro
[2] Fukano, Yoshinobu
[3] Nakano, Akihiko
[4] Ida, Tohru
[5] Morita, Seizo
来源
Sugawara, Yasuhiro | 1600年 / 31期
关键词
Silicon and Alloys;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] OXIDATION SITE OF POLYCRYSTALLINE SILICON SURFACE STUDIED USING SCANNING FORCE TUNNELING MICROSCOPE (AFM STM) IN AIR
    SUGAWARA, Y
    FUKANO, Y
    NAKANO, A
    IDA, T
    MORITA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (6A): : L725 - L727
  • [2] Atomic force microscope combined with scanning tunneling microscope [AFM/STM]
    Morita, Seizo
    Sugawara, Yasuhiro
    Fukano, Yoshinobu
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1993, 32 (6 B): : 2983 - 2988
  • [3] SIMULTANEOUS IMAGING OF A GRAPHITE SURFACE WITH ATOMIC FORCE SCANNING TUNNELING MICROSCOPE (AFM STM)
    SUGAWARA, Y
    ISHIZAKA, T
    MORITA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1990, 29 (08): : 1539 - 1543
  • [4] ATOMIC-FORCE MICROSCOPE COMBINED WITH SCANNING TUNNELING MICROSCOPE [AFM/STM]
    MORITA, S
    SUGAWARA, Y
    FUKANO, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (6B): : 2983 - 2988
  • [5] A study of surfaces using a scanning tunneling microscope (STM)
    Avila Bernal, Alba Graciela
    Bonilla Osorio, Ruy Sebastian
    INGENIERIA E INVESTIGACION, 2009, 29 (03): : 121 - 127
  • [6] INVESTIGATION OF SILICON IN AIR WITH A FAST SCANNING TUNNELING MICROSCOPE
    BESOCKE, KH
    TESKE, M
    FROHN, J
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (02): : 408 - 411
  • [7] SURFACE CHARACTERIZATION OF MATERIALS AT AMBIENT CONDITIONS BY SCANNING-TUNNELING-MICROSCOPY (STM) AND ATOMIC FORCE MICROSCOPY (AFM)
    MAGONOV, SN
    APPLIED SPECTROSCOPY REVIEWS, 1993, 28 (1-2) : 1 - 121
  • [8] HIGHLY SITE-SELECTIVE ADSORPTION OF TRIMETHYLPHOSPHINE ON A SI(111)-(7X7) SURFACE STUDIED BY A SCANNING TUNNELING MICROSCOPE (STM)
    SHIMOMURA, M
    SANADA, N
    FUKUDA, Y
    MOLLER, PJ
    SURFACE SCIENCE, 1995, 341 (03) : L1061 - L1064
  • [9] Scanning tunneling microscope (STM) light emission spectroscopy of surface nanostructures
    Ushioda, S
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2000, 109 (1-2) : 169 - 181
  • [10] THE RECONSTRUCTION OF THE SI(113) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPE
    ARABCZYK, W
    HINRICH, S
    MUSSIG, HJ
    VACUUM, 1995, 46 (5-6) : 473 - 476