High-resolution analysis of semiconductor surface phonons by Raman spectroscopy

被引：0

作者：

Esser, N. ^{[1
]}

Hinrichs, K. ^{[1
]}

Power, J.R. ^{[1
]}

Richter, W. ^{[1
]}

机构：

[1] Inst. für Festkörperphysik, TU. Berlin, Hardenbergstr. 36, D., Berlin, Germany

来源：

Surface Science | 1999年 / 427-428卷

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页码：44 / 52

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