TRENDS IN VLSI TESTING.

被引：0
|
作者：
Chalkley, Michael J.
机构：
来源：
Digest of Papers - Semiconductor Test Symposium | 1979年
关键词：
INTEGRATED CIRCUITS - Large Scale Integration;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
One of the most significant recent developments in VLSI testability is discussed, and a test method of its implementation proposed. Future trends in testers are predicted based on identifiable testing needs.
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页码：3 / 6
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