共 50 条
- [21] WRITING NANOMETER-SCALE SYMBOLS IN GOLD USING THE SCANNING TUNNELING MICROSCOPE - COMMENTAPPLIED PHYSICS LETTERS, 1989, 55 (22) : 2366 - 2366MARELLA, PFPEASE, RF
- [22] Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscopeWEAR, 2003, 254 (10) : 1050 - 1055Iwata, FYamaguchi, MSasaki, A
- [23] NANOMETER-SCALE MODIFICATIONS OF GOLD SURFACES BY SCANNING TUNNELING MICROSCOPEJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03): : 1252 - 1256OHI, AMIZUTANI, WTOKUMOTO, H
- [24] FORMATION OF NANOMETER-SCALE GROOVES IN SILICON WITH A SCANNING TUNNELING MICROSCOPESCIENCE, 1993, 259 (5102) : 1724 - 1726KOBAYASHI, AGREY, FWILLIAMS, RSAONO, M
- [25] APPLICATION OF SURFACE FABRICATION TO STRAIN-MEASUREMENT IN NANOMETER-SCALE WITH THE SCANNING TUNNELING MICROSCOPEJOURNAL OF TESTING AND EVALUATION, 1994, 22 (02) : 121 - 126MIYAHARA, KMATSUOKA, SNAGASHIMA, NMASUDA, H
- [27] Nanometer-scale metal plating using a scanning shear-force microscope with an electrolyte-filled micropipette probeJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (7B): : 4482 - 4485Iwata, FSumiya, YSasaki, A
- [28] Nanometer-scale metal plating using a scanning shear-force microscope with an electrolyte-filled micropipette probe Iwata, F., 1600, Japan Society of Applied Physics (43):
- [29] Nanometer-scale modification of tribomechanical properties of Si(111):H surfaces performed and investigated by a conducting-probe scanning force microscopeJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1268 - 1271Teuschler, TMahr, KMiyazaki, SHundhausen, MLey, L