ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF AIR-OXIDIZED UO2 PELLET SURFACES.

被引：0
|
作者：
Allen, G.C. [1 ]
机构：
[1] CEGB, Berkeley Nuclear Lab,, Berkeley, Engl, CEGB, Berkeley Nuclear Lab, Berkeley, Engl
来源：
Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties | 1985年 / 51卷 / 04期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
10
引用
收藏
页码：465 / 473
相关论文
共 50 条
  • [21] Angle-resolved X-ray photoelectron spectroscopy study of the oxides on Nb surfaces for superconducting r.f. cavity applications
    Ma, Q
    Rosenberg, RA
    APPLIED SURFACE SCIENCE, 2003, 206 (1-4) : 209 - 217
  • [22] APPLICATION OF ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY TO THE STUDY OF GAAS(001) SURFACES AND METAL GAAS(001) INTERFACES
    LEPINE, B
    QUEMERAIS, A
    JEZEQUEL, G
    POLLINI, I
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 28 (1-3): : 527 - 530
  • [23] Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces:: Monte Carlo calculations
    Olejnik, K.
    Zemek, J.
    SURFACE SCIENCE, 2008, 602 (14) : 2581 - 2586
  • [24] X-RAY PHOTOELECTRON SPECTROSCOPIC INVESTIGATION OF ELECTROCHEMICALLY OXIDIZED AND REDUCED PLATINUM SURFACES
    KOVER, L
    UJHELYI, C
    BERENYI, D
    VARGA, D
    KADAR, I
    KOVER, A
    MILLER, J
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (03) : 201 - 214
  • [25] THEORETICAL ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTRA FROM GAAS (110)
    CHASSE, A
    RENNERT, P
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1987, 141 (02): : K147 - K152
  • [26] A time- and angle-resolved X-ray photoelectron spectroscopy study of polystyrene exposed to a helium plasma
    Paynter, RW
    Ménard, M
    Benalia, H
    PLASMA PROCESSES AND POLYMERS, 2004, 1 (02) : 111 - 122
  • [27] Qualitative analysis of a diamondlike carbon film by angle-resolved x-ray photoelectron spectroscopy
    Takabayashi, Susumu
    Motomitsu, Kunihiko
    Takahagi, Takayuki
    Terayama, Akira
    Okamoto, Keishi
    Nakatani, Tatsuyuki
    JOURNAL OF APPLIED PHYSICS, 2007, 101 (10)
  • [28] Angle-resolved x-ray photoelectron spectroscopy study of GeOx growth by plasma post-oxidation
    Zhao, Zhiqian
    Zhang, Jing
    Wang, Xiaolei
    Wei, Shuhua
    Zhao, Chao
    Wang, Wenwu
    CHINESE PHYSICS B, 2017, 26 (10)
  • [29] Profiling nitrogen in ultrathin silicon oxynitrides with angle-resolved x-ray photoelectron spectroscopy
    Chang, JP
    Green, ML
    Donnelly, VM
    Opila, RL
    Eng, J
    Sapjeta, J
    Silverman, PJ
    Weir, B
    Lu, HC
    Gustafsson, T
    Garfunkel, E
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 4449 - 4455
  • [30] Characterization of organic/metal interfaces using angle-resolved X-ray photoelectron spectroscopy
    Ito, Eisuke
    Hara, Masahiko
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (02) : 1393 - 1396
12345