Crystallographic analysis of facets using electron backscatter diffraction

被引：0
|
作者：
Randle, V. [1 ]
机构：
[1] Department of Materials Engineering, University of Wales Swansea, Swansea SA2 8PP, United Kingdom
来源：
Journal of Microscopy | 1999年 / 195卷 / 03期
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学科分类号：
摘要：
Grain boundaries
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页码：226 / 232
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