Crystallographic analysis of facets using electron backscatter diffraction

被引：0

作者：

Randle, V. ^{[1
]}

机构：

[1] Department of Materials Engineering, University of Wales Swansea, Swansea SA2 8PP, United Kingdom

来源：

Journal of Microscopy | 1999年 / 195卷 / 03期

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D O I：

暂无

中图分类号：

学科分类号：

摘要：

Grain boundaries

引用

页码：226 / 232

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