SELF-COMPENSATION OF THE DONOR EFFECT OF BISMUTH IN LEAD TELLURIDE.

被引：0
|
作者：
Bytenskii, L.I.
Kaidanov, V.I.
Makeenko, V.P.
Mel'nik, R.B.
Nemov, S.A.
机构：
来源：
| 1600年 / 18期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
SEMICONDUCTING LEAD COMPOUNDS
引用
收藏
相关论文
共 50 条
  • [21] COMPENSATING EFFECT OF Sn IMPURITY IN CADMIUM TELLURIDE.
    Parfenyuk, O.A.
    Savitskii, A.V.
    Pavlin, P.A.
    Al'bota, A.L.
    Soviet physics journal, 1986, 29 (04): : 308 - 310
  • [22] CHARACTERISTICS OF SELF-COMPENSATION OF THE ACCEPTOR EFFECT OF THALLIUM IN PBS
    ERASOVA, NA
    KAIDANOV, VI
    MELNIK, RB
    NEMOV, SM
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1987, 21 (12): : 1339 - 1340
  • [23] Defects and self-compensation in semiconductors
    Walukiewicz, W
    WIDE-GAP CHALCOPYRITES, 2006, 86 : 35 - 54
  • [24] SELF-COMPENSATION OF CONDUCTIVITY IN SEMICONDUCTORS
    KHOLODAR, GA
    VINETSKI.VL
    SOVIET PHYSICS SOLID STATE,USSR, 1966, 8 (03): : 676 - +
  • [25] Growth of CdTe from Te excess solution and self-compensation of doped donor
    Mochizuki, K
    JOURNAL OF CRYSTAL GROWTH, 2000, 214 : 9 - 13
  • [26] SELF-COMPENSATION OF ACCEPTORS BY VACANCIES IN THALLIUM-DOPED LEAD SULFIDE AND SELENIDE
    BYTENSKII, LI
    KAIDANOV, VI
    MELNIK, RB
    NEMOV, SA
    RAVICH, YI
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1980, 14 (01): : 40 - 43
  • [27] EFFECT OF A SILVER IMPURITY ON THE ELECTRICAL PROPERTIES OFLEAD TELLURIDE.
    ALEKSANDROV, O.V.
    GORINA, YU.M.
    KALYUZHNAYA, G.A.
    KISELEVA, K.V.
    PRUSENKOV, S.N.
    BUI-THI-NI
    1981, (N 7): : 25 - 28
  • [28] MEMS thermal gyroscope with self-compensation of the linear acceleration effect
    Feng, Rui
    Bahari, Jamal
    Jones, John Dewey
    Leung, Albert M.
    SENSORS AND ACTUATORS A-PHYSICAL, 2013, 203 : 413 - 420
  • [29] BIREFRINGENCE MEASUREMENT BY THE SELF-COMPENSATION METHOD
    YI, L
    YI, Z
    SU, XU
    SONG, LA
    APPLIED OPTICS, 1992, 31 (16) : 2968 - 2969
  • [30] A monitoring circuit for a vibromagnetometer with self-compensation
    Sigal, G.P.
    Sokolov, B.Yu.
    Pribory i Tekhnika Eksperimenta, 1995, (01): : 132 - 135
12345