Shear-force sensitive silicon sensor

被引：0
|
作者：
Wang, Lin [1 ]
Beebe, David J. [1 ]
机构：
[1] Dept. of Elec. and Comp. Engineering, Beckman Inst. Adv. Sci. and Technol., Univ. Illinois at Urbana-Champaign, 405 N. Mathews Avenue, Urbana, IL 61801, United States
来源：
American Society of Mechanical Engineers, Dynamic Systems and Control Division (Publication) DSC | 1999年 / 67卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：759 / 763
相关论文
共 50 条
  • [41] Shear-Force Detection by Reusable Quartz Tuning Fork without External Vibration
    Shinya Ohkubo
    Shohei Yamazaki
    Atsuo Takayanagi
    Yukitoshi Otani
    Norihiro Umeda
    Optical Review, 2003, 10 : 128 - 130
  • [42] Shear-force microscopy investigation of roughness and shape of micro-fabricated holes
    Tantussi, Francesco
    Vella, Daniele
    Allegrini, Maria
    Fuso, Francesco
    Romoli, Luca
    Rashed, Choudhury Abul Anam
    PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2015, 41 : 32 - 39
  • [43] Fast and efficient shear-force assisted production of covalently functionalized oxide nanosheets
    Payet, Frederic
    Bouillet, Corinne
    Leroux, Fabrice
    Leuvrey, Cedric
    Rabu, Pierre
    Schosseler, Francois
    Taviot-Gueho, Christine
    Rogez, Guillaume
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2022, 607 : 621 - 632
  • [44] CONSISTENCY MEASUREMENT BY SHEAR-FORCE TRANSMITTERS IN MEDIUM-CONSISTENCY PULPING PROCESSES
    JANSSON, I
    AGNEUS, L
    TAPPI JOURNAL, 1990, 73 (02): : 87 - 91
  • [45] EFFECT OF POSTCOOKING STORAGE-CONDITIONS ON SHEAR-FORCE VALUES OF BEEF STEAKS
    CROUSE, JD
    KOOHMARAIE, M
    JOURNAL OF FOOD SCIENCE, 1990, 55 (03) : 858 - +
  • [46] Shear force sensor for robots
    Zielinska, T
    ISIE'96 - PROCEEDINGS OF THE IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2, 1996, : 49 - 53
  • [47] A structural model of ultra-microelectrodes for shear-force based scanning electrochemical microscopy
    Venkatesh, Vijay
    Northcutt, Robert
    Heinemann, Christian
    Sundaresan, Vishnu Baba
    JOURNAL OF INTELLIGENT MATERIAL SYSTEMS AND STRUCTURES, 2018, 29 (18) : 3562 - 3571
  • [48] Modulated shear-force distance control in near-field scanning optical microscopy
    Brunner, R
    Simon, A
    Stifter, T
    Marti, O
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (03): : 1466 - 1471
  • [49] Near-field optical and shear-force microscopy of single fluorophores and DNA molecules
    Garcia-Parajo, MF
    Veerman, JA
    Ruiter, AGT
    van Hulst, NF
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 311 - 319
  • [50] Instrumentation-level improvements in shear-force near-field acoustic microscopy
    Bai, J.
    Devulapalli, P.
    Brockman, T.
    La Rosa, Andres H.
    XVI MEETING OF PHYSICS, 2018, 1143
12345