Study of the Si(111)√3×√3-Sb structure by x-ray diffraction

被引：0
|
作者：
Nakatani, Shinichiro [1 ]
Saito, Akira [1 ]
Kuwahara, Yuji [1 ]
Takahashi, Toshio [1 ]
Aono, Masakazu [1 ]
Kikuta, Seishi [1 ]
机构：
[1] Univ of Tokyo, Tokyo, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 4 A期
关键词：
Semiconducting Silicon;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：426 / 428
相关论文
共 50 条
  • [21] Multiple scattering study of X-ray photoelectron diffraction from Si(111)-root 3x root 3-Ag surface
    Chen, X
    Abukawa, T
    Tani, J
    Kono, S
    SURFACE SCIENCE, 1996, 357 (1-3) : 560 - 564
  • [22] Interface structure and preferred orientation of Ag/Si(111) revealed by X-ray diffraction
    Akimoto, K
    Lijadi, M
    Ito, S
    Ichimiya, A
    SURFACE REVIEW AND LETTERS, 1998, 5 (3-4) : 719 - 722
  • [23] Interface Structure of an Epitaxial Iron Silicide on Si(111) Studied with X-Ray Diffraction
    Shirasawa, Tetsuroh
    Sekiguchi, Kouji
    Iwasawa, Yusaku
    Voegeli, Wolfgang
    Takahashi, Toshio
    Hattori, Ken
    Hattori, Azusa N.
    Daimon, Hiroshi
    Wakabayashi, Yusuke
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2009, 7 : 513 - 517
  • [24] Interface structure of an epitaxial iron silicide on Si(111) studied with X-Ray diffraction
    Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
    不详
    不详
    不详
    e-J. Surf. Sci. Nanotechnol., (513-517):
  • [25] X-RAY DIFFRACTION DATA ON U3SI
    BOUCHER, RR
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (AUG1) : 326 - &
  • [26] 3-D STRUCTURAL ANALYSIS OF AG/SI(111) INTERFACES BY X-RAY DIFFRACTION.
    Aburano, R. D.
    Hong, Hawoong
    Roesler, J. M.
    Chung, K. -S.
    Chen, H.
    Chiang, T. -C.
    Zschack, P.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C460 - C460
  • [27] Study of the Si(111) "5 x 5"-Cu surface structure by X-ray diffraction and scanning tunneling microscopy
    Nakatani, S
    Kuwahara, Y
    Kuramochi, H
    Takahashi, T
    Aono, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (7A): : L695 - L697
  • [28] X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE SI(111) SQUARE-ROOT3 X SQUARE-ROOT3-AG SURFACE
    KONO, S
    HIGASHIYAMA, K
    SAGAWA, T
    SURFACE SCIENCE, 1986, 165 (01) : 21 - 36
  • [29] Structure of Si(001)-(4x3)-In surface studied by X-ray photoelectron diffraction
    Shimomura, M
    Nakamura, T
    Kim, KS
    Abukawa, T
    Tani, J
    Kono, S
    SURFACE REVIEW AND LETTERS, 1999, 6 (06) : 1097 - 1102
  • [30] STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION
    TAKAHASHI, T
    NAKATANI, S
    OKAMOTO, N
    ISHIKAWA, T
    KIKUTA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05): : L753 - L755
12345