X ray diffraction analysis of the triaxial residual stress state

被引：0
|
作者：
Kraus, Ivo [1 ]
机构：
[1] CVUT Univ, Czech Republic
来源：
Metallic Materials (English translation of Kovove Materialy) (Cambridge, Engl) | 1989年 / 27卷 / 01期
关键词：
X-Ray Analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The author discusses several consequences of the finite depth of penetration of x-radiation on the reliability of tensometric interpretation of the results of measurements of lattice strains. Attention was given mainly to materials based on α-Fe. In applying conventional tensometric methods, the finite depth of penetration of radiation has a detrimental effect on stress with the gradient in the direction of the surface normal mainly in cases in which the calculations are based on the lattice strains which correspond to small angles.
引用
收藏
页码：28 / 30
相关论文
共 50 条
  • [21] X-ray diffraction residual stress analysis on PVD-multilayer coatings
    Tillmann, W.
    Selvadurai-Lassl, U.
    Vogli, E.
    Fischer, G.
    Hoffmann, F.
    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2010, 41 (06) : 482 - 488
  • [22] Structural and residual stress analysis by X-ray diffraction on polymeric materials and composites
    Hauk, V
    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 1999, 30 (07) : 377 - 384
  • [23] THE EFFECT OF SAMPLE POSITION ON THE DETERMINATION OF TRIAXIAL STRESS BY X-RAY-DIFFRACTION
    FENN, RH
    JONES, AM
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 38 - 40
  • [24] Residual Stress Analysis of materials and components by X-ray and neutron diffraction.
    Pyzalla, A
    Reimers, W
    MATERIALPRUFUNG, 1998, 40 (7-8): : 303 - 309
  • [25] The effect of sample position on the determination of triaxial stress by X-ray diffraction
    Fenn, R.H.
    Jones, A.M.
    Journal of Applied Crystallography, 1988, 21 (01): : 38 - 41
  • [26] Determination of Triaxial Residual Stress in Plasma-Sprayed Hydroxyapatite (HAp) Deposited on Titanium Substrate by X-ray Diffraction
    N. Bosh
    H. Mozaffari-Jovein
    C. Müller
    Journal of Thermal Spray Technology, 2018, 27 : 1238 - 1250
  • [27] Determination of Triaxial Residual Stress in Plasma-Sprayed Hydroxyapatite (HAp) Deposited on Titanium Substrate by X-ray Diffraction
    Bosh, N.
    Mozaffari-Jovein, H.
    Mueller, C.
    JOURNAL OF THERMAL SPRAY TECHNOLOGY, 2018, 27 (08) : 1238 - 1250
  • [28] Evaluation of Residual Stress by X-Ray Diffraction and Correlative Stress Modelling
    Kumar, Sandeep
    Crivoi, Alexandru
    Tan, Ming Jen
    Tai, Anna
    Marinescu, Iulian
    RESIDUAL STRESSES 2016: ICRS-10, 2017, 2 : 211 - 216
  • [29] Residual and Bending Stress Measurements by X-Ray Diffraction and Synchrotron Diffraction Analysis in Silicon Solar Cells
    Popovich, V. A.
    van der Pers, N.
    Janssen, M.
    Bennett, I. J.
    Jansen, K. M. B.
    Wright, J.
    Richardson, I. M.
    2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2012,
  • [30] X-RAY-DIFFRACTION INVESTIGATION OF TRIAXIAL RESIDUAL-STRESSES IN COMPOSITE-MATERIALS
    FENN, RH
    JONES, AM
    WELLS, GM
    JOURNAL OF COMPOSITE MATERIALS, 1993, 27 (14) : 1338 - 1351
12345