FLUX-TRAPPING CHARACTERISTICS OF Pb-ALLOY SUPERCONDUCTING THIN FILMS FOR JOSEPHSON TUNNEL JUNCTIONS.

被引：0

作者：

Uchida, Naoto ^{[1
]}

Enpuku, Keiji ^{[1
]}

Yoshida, Keiji ^{[1
]}

Irie, Fujio ^{[1
]}

机构：

[1] Kyushu Univ, Dep of Electronics,, Fukuoka, Jpn, Kyushu Univ, Dep of Electronics, Fukuoka, Jpn

来源：

| 1984年 / 27期

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[21] HIGH-RELIABILITY PB-ALLOY JOSEPHSON-JUNCTIONS FOR INTEGRATED-CIRCUITS
HUANG, HCW
BASAVAIAH, S
KIRCHER, CJ
HARRIS, EP
MURAKAMI, M
KLEPNER, SP
GREINER, JH
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (10) : 1979 - 1987
[22] EFFECT OF PROCESS VARIABLES ON ELECTRICAL-PROPERTIES OF PB-ALLOY JOSEPHSON-JUNCTIONS
BROOM, RF
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[23] SUBHARMONIC STRUCTURE OF THE VOLT-AMPERE CHARACTERISTICS OF SUPERCONDUCTING TUNNEL JUNCTIONS.
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[24] SELF-POSITIONED THIN PB-ALLOY BASE ELECTRODE JOSEPHSON JUNCTION
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[26] MICROSTRUCTURE OF FINE-GRAINED PB-ALLOY FILMS FOR JOSEPHSON INTEGRATED-CIRCUITS
HASUMI, Y
WAHO, T
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[27] SUPERCONDUCTING THIN-FILMS STRUCTURES FOR JOSEPHSON-JUNCTIONS
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[28] COMPARISON OF TEMPERATURE CYCLING STABILITY OF PB-ALLOY JOSEPHSON-JUNCTIONS WITH VARIOUS COUNTER ELECTRODE MATERIALS
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PEI, SS
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[29] IMPURITY EFFECTS IN RF O-2 PLASMA OXIDATION FOR PB-ALLOY JOSEPHSON-JUNCTIONS
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[30] INFLUENCE OF MICROWAVES ON THE CURRENT-VOLTAGE CHARACTERISTIC OF Nb-NbOx-Pb JOSEPHSON TUNNEL JUNCTIONS.
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