STUDY OF EGYPTIAN BENTONITE BY X-RAY DIFFRACTION METHOD.

被引：0
|
作者：
El-Hiti, A.S.
机构：
来源：
| 1978年 / 111卷 / 03期
关键词：
CLAY; -; Analysis;
D O I：
暂无
中图分类号：
TU4 [土力学、地基基础工程];
学科分类号：
081401 ;
摘要：
Newly discovered Egyptian bentonite was subjected to detailed methods of x-ray diffraction analyses. Oriented aggregate method was used in the preparation of the sample for the examination of clays. The advantage of this method is that the enhancement of diagnostic reflections allows them to be seen when the mineral is present in small proportions. X-ray quantitative analysis was carried out using internal standard method. The raw mineral was composed of bentonite clay and free silica.
引用
收藏
页码：138 / 141
相关论文
共 50 条
  • [21] X-RAY DIFFRACTION STUDY OF HGTE
    IVANOVOMSKII, VI
    KOLOMIET.BT
    KLESHCHI.LI
    SMEKALOV.KP
    SOVIET PHYSICS SOLID STATE,USSR, 1969, 10 (10): : 2447 - +
  • [22] X-RAY DIFFRACTION STUDY OF LIMONITE
    DASGUPTA, DR
    MAITRA, JC
    ACTA CRYSTALLOGRAPHICA, 1952, 5 (06): : 851 - 852
  • [23] MONITORING SHELL TARGETS BY AN X-RAY SCHLIEREN METHOD.
    Goetz, K.
    Kalashnikov, M.P.
    Mikhailov, Yu.A.
    Sklizkov, G.V.
    Fedotov, S.I.
    Foerster, E.
    Zaumseil, A.
    1600,
  • [24] AN X-RAY DIFFRACTION STUDY OF HUMIFICATION
    RILEY, HL
    JOURNAL OF SOIL SCIENCE, 1949, 1 (01): : 104 - 111
  • [25] X-Ray diffraction study of gallstones
    Nikitina, E.
    Kuz'micheva, G.
    Orlova, S.
    Efimova, Yu
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2004, 60 : S229 - S229
  • [26] X-RAY DIFFRACTION STUDY OF LEUCOSPHENITE
    SHUMYATSKAYA, NG
    VORONKOV, AA
    BELOV, NV
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1971, 16 (03): : 416 - +
  • [27] An X-ray diffraction study of chicle
    Stillwell, CW
    INDUSTRIAL AND ENGINEERING CHEMISTRY, 1931, 23 : 703 - 706
  • [28] X-RAY DIFFRACTION METHOD OF DETERMINING SUBSTRUCTURE
    PINES, BY
    BADIYAN, EE
    SIRENKO, AF
    SOLNYSHK.DD
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1967, 12 (03): : 365 - &
  • [29] MEASUREMENT OF IRON AND NICKEL CONCENTRATION CHANGES IN GOLD LAYERS - 1. X-RAY DIFFRACTION METHOD.
    Dubsky, Jiri
    Chraska, Pavel
    Kriva, Jiri
    Praktische Metallographie/Practical Metallography, 1979, 16 (09): : 436 - 441
  • [30] Structural study of Chulucanas clays by X-ray diffraction and Rietveld method
    Zeballos-Velasquez, Elvira L.
    Melero, Patricia C.
    Trujillo, Alejandro L.
    Mejia, Mirian E.
    Ceroni, Mario
    MATERIA-RIO DE JANEIRO, 2014, 19 (02): : 159 - 170
12345