RELIABILITY TEST.

被引：0
|
作者：
Engelmaier, Werner [1 ]
机构：
[1] AT&T Bell Lab, Whippany, NJ, USA, AT&T Bell Lab, Whippany, NJ, USA
来源：
Circuits manufacturing | 1988年 / 28卷 / 06期
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摘要：
10
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