Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy

被引：0
|
作者：
机构：
来源：
Appl Phys Lett | / 13卷 / 1871期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] The ballistic electron emission microscopy in the characterization of quantum dots
    Hutagalung, S. D.
    Yaacob, K. A.
    Keat, Y. C.
    NANOSCIENCE AND TECHNOLOGY, PTS 1 AND 2, 2007, 121-123 : 529 - 532
  • [32] ELECTRON TRAPPING IN THIN SIO2 FILMS DUE TO AVALANCHE CURRENTS
    NEUGEBAUER, CA
    BURGESS, JF
    JOYNSON, RE
    MUNDY, JL
    THIN SOLID FILMS, 1972, 13 (01) : 5 - +
  • [33] Electron transport in ultra-thin films and ballistic electron emission microscopy
    Claveau, Y.
    Di Matteo, S.
    de Andres, P. L.
    Flores, F.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2017, 29 (11)
  • [34] ELECTRON TRAPPING IN ELECTRON-BEAM IRRADIATED SIO2
    AITKEN, JM
    YOUNG, DR
    PAN, K
    JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) : 3386 - 3391
  • [35] HOT-ELECTRON BALLISTIC TRANSPORT IN 2-DIMENSIONAL STRUCTURES
    PALEVSKI, A
    SIVAN, U
    HEIBLUM, M
    UMBACH, CP
    STRICKMAN, H
    ACTA PHYSICA POLONICA A, 1991, 79 (01) : 59 - 69
  • [36] EFFECT OF HYDROGEN ON HOT-ELECTRON ENERGY RELAXATION IN SIO2 AND SI3N4 FILMS
    ESAEV, DG
    EFIMOV, VM
    SHKLYAEV, AA
    THIN SOLID FILMS, 1992, 221 (1-2) : 160 - 165
  • [37] ELECTRON SELF-TRAPPING IN SIO2
    ASLAM, M
    JOURNAL OF APPLIED PHYSICS, 1987, 62 (01) : 159 - 162
  • [38] Blocking Hot Electron Emission by SiO2 Coating Plasmonic Nanostructures
    Takeyasu, Nobuyuki
    Yamaguchi, Kenzo
    Kagawa, Ryusuke
    Kaneta, Takashi
    Benz, Felix
    Fujii, Masamitsu
    Baumberg, Jeremy J.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2017, 121 (34): : 18795 - 18799
  • [39] Nanoscale characterization of oxidized ultrathin Co-films by ballistic electron emission microscopy
    Goh, Kuan Eng Johnson
    Wang, Simin
    Tan, Siew Ting Melissa
    Zhang, Zheng
    Kawai, Hiroyo
    Troadec, Cedric
    Ng, Vivian
    MATERIALS RESEARCH EXPRESS, 2016, 3 (01):
  • [40] Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy
    Im, HJ
    Ding, Y
    Pelz, JP
    Heying, B
    Speck, JS
    PHYSICAL REVIEW LETTERS, 2001, 87 (10) : art. no. - 106802
12345