Secondary ion mass spectrometry (SIMS), a new method for the analysis of solids

被引：0

作者：

Maul, J. ^{[1
]}

Flueckiger, U. ^{[1
]}

机构：

[1] Ber. Massenspektrometrie, ATOMIKA Techn. Phys. GmbH, D-8000 Munchen 19, Germany

来源：

Kerntechnik und Atompraxis | 1978年 / 20卷 / 10期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Nuclear fuels

引用

页码：467 / 470

共 50 条

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