Nanostructure fabrication with laser radiation in the nearfield of a scanning-probe microscope tip

被引：0
|
作者：
FB Physikalische Technik, Steinfurt, Germany [1 ]
机构：
来源：
Conf Proc Laser Electr Optic Soc Annu Meet | / 461期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope
    Pangaribuan, Togar
    Yamada, Kazunobu
    Jiang, Shudong
    Ohsawa, Hisao
    Ohtsu, Motoichi
    Japanese Journal of Applied Physics, Part 2: Letters, 1992, 31 (9 A):
  • [22] Tip characterization for scanning probe microscope width metrology
    Dongmo, S
    Villarrubia, JS
    Jones, SN
    Renegar, TB
    Postek, MT
    Song, JF
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 843 - 848
  • [23] Polarization Reversal by Tip of Scanning Probe Microscope in SBN
    Neradovskaya, E. A.
    Neradovskiy, M. M.
    Fedorovyh, V. V.
    Turygin, A. P.
    Shur, V. Ya.
    Kholkin, A. L.
    Ivleva, I. L.
    IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY, 2016, 2016 : 115 - 121
  • [24] Kinetics of tip induced oxidation by scanning probe microscope
    Gavrilov, SA
    Lemeshko, SV
    Shevyakov, VI
    Roschin, VM
    PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES TO NANOMEETING-2001, 2001, : 313 - 316
  • [25] Scanning probe microscope tip with carbon nanotube truss
    Akita, S. (akita@pe.osakafu-u.ac.jp), 1600, Japan Society of Applied Physics (43):
  • [26] Scanning probe microscope tip with carbon nanotube truss
    Akita, S
    Nakayama, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (7B): : 4499 - 4501
  • [27] Atomic force microscope integrated with a scanning electron microscope for tip fabrication
    Walters, D.A., 1600, American Inst of Physics, Woodbury, NY, United States (65):
  • [28] Combined focused ion beam deposition system and scanning probe microscope for metal nanostructure fabrication and characterization
    Woodham, R.G.
    Ahmed, H.
    Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17 : 3075 - 3079
  • [29] Combined focused ion beam deposition system and scanning probe microscope for metal nanostructure fabrication and characterization
    Woodham, RG
    Ahmed, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 3075 - 3079
  • [30] Nanostructure fabrication for future nanodevices using a scanning tunneling microscope
    Onishi, K
    Kumakura, T
    Fujita, D
    SUPERLATTICES AND MICROSTRUCTURES, 2002, 32 (4-6) : 249 - 253
12345