Automating RF test applications

被引：0
|
作者：
Natl Instruments, Austin, United States [1 ]
机构：
来源：
Microwave J | / 10卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Automating Workflows with Service Oriented Media Applications
    Van der Weken, D.
    Van Assche, S.
    Clabaut, D.
    Desmet, S.
    Volckaert, B.
    2009 IEEE CONGRESS ON SERVICES (SERVICES-1 2009), VOLS 1 AND 2, 2009, : 507 - +
  • [42] Automating Seccomp Filter Generation for Linux Applications
    Canella, Claudio
    Werner, Mario
    Gruss, Daniel
    Schwarz, Michael
    PROCEEDINGS OF THE 2021 CLOUD COMPUTING SECURITY WORKSHOP, CCSW 2021, 2021, : 139 - 151
  • [43] Automating Coverage Metrics For Dynamic Web Applications
    Alalfi, Manar H.
    Cordy, James R.
    Dean, Thomas R.
    14TH EUROPEAN CONFERENCE ON SOFTWARE MAINTENANCE AND REENGINEERING (CSMR 2010), 2010, : 51 - 60
  • [44] Automating Environmental Computing Applications with Scientific Workflows
    da Silva, Rafael Ferreira
    Deelman, Ewa
    Filgueira, Rosa
    Vahi, Karan
    Rynge, Mats
    Mayani, Rajiv
    Mayer, Benjamin
    PROCEEDINGS OF THE 2016 IEEE 12TH INTERNATIONAL CONFERENCE ON E-SCIENCE (E-SCIENCE), 2016, : 400 - 406
  • [45] AUTOMATING TOUR DESIGN WITH APPLICATIONS FOR A EUROPA LANDER
    Martin, Kaela
    Landau, Damon
    Campagnola, Stefano
    Karimi, Reza
    Pellegrini, Etienne
    McElrath, Timothy
    SPACEFLIGHT MECHANICS 2019, VOL 168, PTS I-IV, 2019, 168 : 517 - 529
  • [46] A 3000 hours DC life test on AlGaN/GaN HEMT for RF and microwave applications
    Sozza, A
    Dua, C
    Morvan, E
    Grimber, B
    Delage, SL
    MICROELECTRONICS RELIABILITY, 2005, 45 (9-11) : 1617 - 1621
  • [47] A novel RF-WAT test structure for advanced process monitoring in SOC applications
    Chen, David C.
    Lee, Ryan
    Liu, Y. C.
    Tang, Mao Chyuan
    Chiang, Gavin
    Kuo, Annie
    Yeh, C. S.
    Chien, S. C.
    Sun, S. W.
    2007 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS, 2007, : 243 - +
  • [48] Automating the rank order test for printing quality evaluation
    Cui, CW
    Hassebrook, LG
    Guan, C
    Love, S
    PICS 2002: IMAGE PROCESSING, IMAGE QUALITY, IMAGE CAPTURE, SYSTEMS CONFERENCE, PROCEEDINGS, 2002, : 99 - 103
  • [49] Automating Test Oracle Generation in DevOps for Industrial Elevators
    Arrieta, Aitor
    Otaegi, Maialen
    Han, Liping
    Sagardui, Goiuria
    Ali, Shaukat
    Arratibel, Maite
    2022 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE ANALYSIS, EVOLUTION AND REENGINEERING (SANER 2022), 2022, : 284 - 288
  • [50] Automating the process of test derivation from SDL specifications
    VonBochmann, G
    Petrenko, A
    Bellal, O
    Maguiraga, S
    SDL '97 - TIME FOR TESTING: SDL, MSC AND TRENDS, 1997, : 261 - 276
12345