共 50 条
- [17] Application of secondary neutral mass spectrometry in low-energy sputtering yield measurements NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 129 (01): : 123 - 129
- [18] Low energy sputtering of nickel by normally incident xenon ions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 234 (04): : 441 - 457
- [19] Effect of low-energy ion bombardment during the sputtering on the crystal structure of FePt films FUNCTIONAL MATERIALS, 2008, 15 (03): : 356 - 363