Strain in nanoscale germanium hut clusters on Si(001) studied by x-ray diffraction

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Steinfort, A.J.
Scholte, P.M.L.O.
Ettema, A.
Tuinstra, F.
Nielsen, M.
Landemark, E.
Smilgies, D.-M.
Feidenhans'l, R.
Falkenberg, G.
Seehofer, L.
Johnson, R.L.
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| 2009年 / 77期
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