Reflectivity Measurements around 65 nm on Multilayer Mirrors Used in Free Electron Laser.

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作者：
Elleaume, P. [1 ]
Velghe, M. [1 ]
Billardon, M. [1 ]
Ortega, J.M. [1 ]
机构：
[1] CEN Saclay, Service de, Photophysique, Orsay, Fr, CEN Saclay, Service de Photophysique, Orsay, Fr
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| 1600年 / 15期
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摘要：
MIRRORS
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