INVESTIGATION OF COMPOSITION PROFILES IN THIN PHOSPHORUS-SILICATE GLASS LAYERS.

被引：0
|
作者：
Shirshov, Yu.M. [1 ]
Nabok, A.V. [1 ]
Kopylov, O.N. [1 ]
Kropman, D.I. [1 ]
机构：
[1] Acad of Sciences of the Ukrainian, SSR, Kiev, USSR, Acad of Sciences of the Ukrainian SSR, Kiev, USSR
来源：
Physica Status Solidi (A) Applied Research | 1986年 / 95卷 / 01期
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摘要：
GLASS
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页码：185 / 192
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