Unified compact scalable ΔId model for hot carrier reliability simulation

被引：0
|
作者：
Chen, Ping [1 ]
Wu, Lifeng [1 ]
Zhang, Gang [1 ]
Liu, Zhihong [1 ]
机构：
[1] BTA Technology, Inc, Santa Clara, United States
来源：
Annual Proceedings - Reliability Physics (Symposium) | 1999年
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页码：243 / 248
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