EFFECT OF APPLIED ELECTRIC FIELD ON TSIC MEASUREMENTS.

被引：0

作者：

Tan Changhua

Xu Mingzhen

机构：

来源：

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1983年 / 4卷 / 05期

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D O I：

暂无

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学科分类号：

摘要：

ELECTRIC FIELDS

引用

页码：439 / 443

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