EFFECT OF APPLIED ELECTRIC FIELD ON TSIC MEASUREMENTS.

被引：0
|
作者：
Tan Changhua
Xu Mingzhen
机构：
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1983年 / 4卷 / 05期
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暂无
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学科分类号：
摘要：
ELECTRIC FIELDS
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页码：439 / 443
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