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- [43] CHARGING, LONG-TERM STABILITY AND TSD MEASUREMENTS OF SIO2 ELECTRETS IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (03): : 439 - 442
- [44] Charge storage in double layers of thermally grown silicon dioxide and APCVD silicon nitride IEEE Trans Dielectr Electr Insul, 6 (852-857):