ANALYSIS OF X-RAY POWDER DIFFRACTION PROFILE.

被引：0
|
作者：
Kasai, Naoko
Nishihara, Yoshikazu
Kinoshita, Tatsue
Yamaguchi, Yuji
机构：
来源：
Bulletin of the Electrotechnical Laboratory, Tokyo | 1980年 / 44卷 / 04期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
DIFFRACTOMETERS
引用
收藏
页码：259 / 267
相关论文
共 50 条
  • [21] Analysis of fresco pigments and substrates by powder x-ray diffraction
    Miller, Steven
    Smalley, Arwyn
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2016, 251
  • [22] X-ray powder diffraction analysis of ±fenoprofen calcium dihydrate
    Tobien, AA
    Varlashkin, P
    POWDER DIFFRACTION, 2002, 17 (03) : 244 - 246
  • [23] EXTRUSION OF CYLINDRICAL SPECIMENS FOR X-RAY POWDER DIFFRACTION ANALYSIS
    HOFER, LJE
    DAMICK, A
    HEADRICK, AF
    FAUTH, F
    BEAN, EH
    GOLDEN, PL
    ANALYTICAL CHEMISTRY, 1957, 29 (10) : 1563 - 1564
  • [24] Understanding the instrumental profile of synchrotron radiation X-ray powder diffraction beamlines
    Rebuffi, Luca
    del Rio, Manuel Sanchez
    Busetto, Edoardo
    Scardi, Paolo
    JOURNAL OF SYNCHROTRON RADIATION, 2017, 24 : 622 - 635
  • [25] The X-ray powder diffraction profile analysis of analcimes from the teschenitic sills of the Outer Carpathians, Poland
    Kapusta, J.
    Wlodyka, R.
    Neues Jahrbuch fuer Mineralogie. Monatshefte, (06):
  • [26] The x-ray powder diffraction profile analysis of analcimes from the teschenitic sills of the Outer Carpathians, Poland
    Kapusta, J
    Wlodyka, R
    NEUES JAHRBUCH FUR MINERALOGIE-MONATSHEFTE, 1997, (06): : 241 - 255
  • [27] Analysis of full-profile x-ray diffraction multiplets
    Serykh, VP
    INDUSTRIAL LABORATORY, 1999, 65 (06): : 375 - 377
  • [28] Profile analysis of thin film X-ray diffraction peaks
    Bimbault, L
    Badawi, KF
    Goudeau, P
    Branger, V
    Durand, N
    THIN SOLID FILMS, 1996, 275 (1-2) : 40 - 43
  • [29] COMPUTER PROGRAM FOR X-RAY DIFFRACTION LINE PROFILE ANALYSIS
    UNGAR, T
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (01): : 114 - &
  • [30] Three-beam X-ray diffraction - profile analysis
    Thorkildsen, G
    Larsen, HB
    Weckert, E
    Semmingsen, D
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2003, 36 : 1324 - 1333
12345