ERROR AUTOCOMPENSATION AS A STRUCTURAL METHOD OF MEASURING INSTRUMENT ACCURACY.

被引：0

作者：

Zagorskii, Ya.T.

机构：

来源：

Measurement Techniques | 1986年 / 29卷 / 10期

关键词：

MEASUREMENT ERRORS - TRANSISTORS;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

By autocompensation is meant a state in the device in which the processes functionally related to any external influencing factor lead to independent deterministic error correction. Autocompensation in an electronic measuring instrument requires appropriate relationships between the transistor parameters, the passive components (usually resistors), and the stage working points. One incorporates the effects of the influencing factor on the parameters of the structured circuits and provides conditions for purposive modification. The conditions usually include changes in stage working point and in transistor dynamic parameters. Any changes occurring continuously and at the same time as external factors can be distinguished by spatial rather than time separation.

引用

页码：899 / 904

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