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- [1] MEDIUM-ENERGY ION-SCATTERING AND STM STUDIES ON CU/SI(111) NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 99 (1-4): : 495 - 498
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- [5] High depth resolution analysis of Cu/Si(111) "5 x 5" structure with medium energy ion scattering NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 136 : 1086 - 1091
- [7] Medium-energy ion-scattering study of the temperature dependence of the structure of Cu(111) PHYSICAL REVIEW B, 1996, 54 (19): : 14082 - 14086
- [9] STM studies of vicinal Si(111) and Si(331) surfaces PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 1998, 12 : 85 - 92
- [10] MEDIUM-ENERGY ION-SCATTERING STUDY OF THE SI(111) - AS-1X1 SURFACE JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (03): : 637 - 638