XPS analysis of metal grain boundary surfaces

被引：0
|
作者：
机构：
来源：
Surf Interface Anal | / 3卷 / 133期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] XPS analysis of the instability of Ni-based melt surfaces
    Sapozhnikov, G. V.
    Kholzakov, A. V.
    Shabanova, I. N.
    Ponomarev, A. G.
    Kazanzev, A. E.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (40-41) : 4315 - 4318
  • [42] A REVIEW OF THE ANALYSIS OF SURFACES AND THIN-FILMS BY AES AND XPS
    SEAH, MP
    VACUUM, 1984, 34 (3-4) : 463 - 478
  • [43] Friction reduction by metal sulfides in boundary lubrication studied by XPS and XANES analyses
    De Barros, MI
    Bouchet, J
    Raoult, I
    Le Mogne, T
    Martin, JM
    Kasrai, M
    Yamada, Y
    WEAR, 2003, 254 (09) : 863 - 870
  • [44] Quantitative XPS analysis of PEG-modified silicon surfaces
    Popat, KC
    Sharma, S
    Desai, TA
    JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (17): : 5185 - 5188
  • [45] Initial oxidation behaviors of nitride surfaces of uranium by XPS analysis
    Liu, Kezhao
    Luo, Lizu
    Luo, Lili
    Long, Zhong
    Hong, Zhanglian
    Yang, Hui
    Wu, Sheng
    APPLIED SURFACE SCIENCE, 2013, 280 : 268 - 272
  • [46] First-principles analysis of the grain boundary segregation of transition metal alloying elements in γFe
    Ito, Kazuma
    Sawada, Hideaki
    COMPUTATIONAL MATERIALS SCIENCE, 2022, 210
  • [47] Deformation and boundary motion analysis of a faceted twin grain boundary
    Dora, T. L.
    Singh, Sandeep Kumar
    Mishra, Radha Raman
    Homer, Eric R.
    Ogata, Shigenobu
    Verma, Akarsh
    INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES, 2024, 269
  • [48] Defect character at grain boundary facet junctions: Analysis of an asymmetric Σ=5 grain boundary in Fe
    Medlin, D. L.
    Hattar, K.
    Zimmerman, J. A.
    Abdeljawad, F.
    Foiles, S. M.
    ACTA MATERIALIA, 2017, 124 : 383 - 396
  • [49] WEAR OF BOUNDARY-LUBRICATED METAL-SURFACES
    KOMVOPOULOS, K
    SUH, NP
    SAKA, N
    WEAR, 1986, 107 (02) : 107 - 132
  • [50] XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)-silicon thin films
    Reiche, R
    Oswald, S
    Wetzig, K
    APPLIED SURFACE SCIENCE, 2001, 179 (1-4) : 316 - 323
12345