Characterization of multilayer ceramic membranes with the atomic force microscope

被引：0
|
作者：
Technical Univ of Denmark, Lyngby, Denmark [1 ]
机构：
来源：
Key Eng Mat | / Pt 3卷 / 1707-1710期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] CHARACTERIZATION OF ATOMIC-FORCE MICROSCOPE TIPS BY ADHESION FORCE MEASUREMENTS
    THUNDAT, T
    ZHENG, XY
    CHEN, GY
    SHARP, SL
    WARMACK, RJ
    SCHOWALTER, LJ
    APPLIED PHYSICS LETTERS, 1993, 63 (15) : 2150 - 2152
  • [22] Atomic force microscope studies of membranes: Surface pore structures of Cyclopore and Anopore membranes
    J Membr Sci, 2 (233):
  • [23] Atomic force microscope studies of membranes: Surface pore structures of Cyclopore and Anopore membranes
    Bowen, WR
    Hilal, N
    Lovitt, RW
    Williams, PM
    JOURNAL OF MEMBRANE SCIENCE, 1996, 110 (02) : 233 - 238
  • [24] Atomic force microscope studies of membranes: Surface pore structures of diaflo ultrafiltration membranes
    Bowen, WR
    Hilal, N
    Lovitt, RW
    Williams, PM
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1996, 180 (02) : 350 - 359
  • [25] Atomic force microscope
    不详
    MICRO, 1995, 13 (10): : 22 - 22
  • [26] THE ATOMIC FORCE MICROSCOPE
    GOH, MC
    MARKIEWICZ, P
    CHEMISTRY & INDUSTRY, 1992, (18) : 687 - 691
  • [27] ATOMIC FORCE MICROSCOPE
    TSUDA, N
    INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING, 1991, 25 (04): : 253 - 258
  • [28] Atomic force microscope
    不详
    MICRO, 1995, 13 (02): : 46 - 46
  • [29] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [30] An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
    Andany S.H.
    Hlawacek G.
    Hummel S.
    Brillard C.
    Kangül M.
    Fantner G.E.
    Beilstein Journal of Nanotechnology, 2020, 11 : 1272 - 1279
12345