Surface morphology of organic thin films

被引：0
|
作者：
Fraxedas, J. [1 ]
Caro, J. [1 ]
Santiso, J. [1 ]
Figueras, A. [1 ]
Gorostiza, P. [2 ]
Sanz, F. [2 ]
机构：
[1] Inst. de Cie. de Mat. de Barcelona, Campus de la UAB, E-08193 Bellaterra, Spain
[2] Dept. de Quim.-Física, Universitat de Barcelona, Martí i Franqués 1, E-08028 Barcelona, Spain
来源：
Applied Surface Science | 1999年 / 144卷
关键词：
Atomic force microscopy - Crystal defects - Molecular structure - Morphology - Organic compounds - Surface roughness - Surface structure - Surface topography - Surfaces - Vapor deposition;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：623 / 626
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