Self-sensitive probe composed of a piezoelectric tuning fork and a bent optical fiber tip for scanning near-field optical/atomic force microscopy

被引：0
|
作者：
Muramatsu, Hiroshi [1 ]
Yamamoto, Noritaka [1 ]
Umemoto, Takeshi [1 ]
Homma, Katsunori [1 ]
Chiba, Norio [1 ]
Fujihira, Masamichi [1 ]
机构：
[1] Seiko Instruments Inc, Chiba, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1997年 / 36卷 / 9 A期
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页码：5753 / 5758
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