Scanning probe microscopy of ion-irradiated materials

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作者：
Neumann, R. [1 ]
机构：
[1] Gesell. Schwerionenforschung (GSI), Planckstraße 1, D-64291, Darmstadt, Germany
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1999年 / 151卷 / 1-4期
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页码：42 / 55
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