Simulation-based design error diagnosis and correction in combinational digital circuits

被引：0

作者：

Nayak, Debashis ^{[1
]}

Walker, D.M.H. ^{[1
]}

机构：

[1] Cadence Design Systems, Chelmsford, United States

来源：

Proceedings of the IEEE VLSI Test Symposium | 1999年

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D O I：

暂无

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学科分类号：

摘要：

引用

页码：70 / 78

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