Simulation-based design error diagnosis and correction in combinational digital circuits

被引：0
|
作者：
Nayak, Debashis [1 ]
Walker, D.M.H. [1 ]
机构：
[1] Cadence Design Systems, Chelmsford, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 1999年
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摘要：
30
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页码：70 / 78
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