Characterization of power MESFETs on 4H-SiC conductive and semi-insulating wafers

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作者：
Noblanc, O. [1 ]
Arnodo, C. [1 ]
Chartier, E. [1 ]
Brylinski, C. [1 ]
机构：
[1] Thomson-CSF, Orsay, France
来源：
Materials Science Forum | 1998年 / 264-268卷 / pt 2期
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页码：949 / 952
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