Analysis of active slip systems in metals plastically deformed by alternating load using electron diffraction techniques in the scanning electron microscope

被引:0
|
作者
Blochwitz, C.
Brechbuehl, J.
Tirschler, W.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
    Trager-Cowan, C.
    Alasmari, A.
    Avis, W.
    Bruckbauer, J.
    Edwards, P. R.
    Hourahine, B.
    Kraeusel, S.
    Kusch, G.
    Jablon, B. M.
    Johnston, R.
    Martin, R. W.
    Mcdermott, R.
    Naresh-Kumar, G.
    Nouf-Allehiani, M.
    Pascal, E.
    Thomson, D.
    Vespucci, S.
    Mingard, K.
    Parbrook, P. J.
    Smith, M. D.
    Enslin, J.
    Mehnke, F.
    Kneissl, M.
    Kuhn, C.
    Wernicke, T.
    Knauer, A.
    Hagedorn, S.
    Walde, S.
    Weyers, M.
    Coulon, P-M
    Shields, P. A.
    Zhang, Y.
    Jiu, L.
    Gong, Y.
    Smith, R. M.
    Wang, T.
    Winkelmann, A.
    EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 2020, 891
  • [23] DIFFRACTION FROM SUB-MICRON AREAS USING ELECTRON BACKSCATTERING IN A SCANNING ELECTRON-MICROSCOPE
    DINGLEY, DJ
    SCANNING ELECTRON MICROSCOPY, 1984, : 569 - 575
  • [24] Characterization of Portland cement clinker by Electron Backscatter Diffraction (EBSD) analysis in the Scanning Electron Microscope (SEM)
    Roessler, Christiane
    Moeser, Bernd
    Ludwig, Horst-Michael
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 253
  • [25] PHASE IDENTIFICATION USING BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE
    DINGLEY, DJ
    ALABASTER, C
    COVILLE, R
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1990, (98): : 451 - 454
  • [26] QUANTITATIVE COMPOSITION ANALYSIS USING THE BACKSCATTERED ELECTRON SIGNAL IN A SCANNING ELECTRON-MICROSCOPE
    ROBINSON, VNE
    CUTMORE, NG
    BURDON, RG
    SCANNING ELECTRON MICROSCOPY, 1984, : 483 - 492
  • [27] QUANTITATIVE COMPOSITION ANALYSIS USING THE BACKSCATTERED ELECTRON SIGNAL IN A SCANNING ELECTRON MICROSCOPE.
    Robinson, V.N.E.
    Cutmore, N.G.
    Burdon, R.G.
    Scanning Electron Microscopy, 1984, v : 483 - 492
  • [28] Analysis of Heavy Metals in the Endometrial Tissue Using Electron Microscope
    Canan Soyer
    Merih Bayram
    Environmental Monitoring and Assessment, 2007, 130 : 141 - 147
  • [29] Analysis of heavy metals in the endometrial tissue using electron microscope
    Soyer, Canan
    Bayram, Merih
    ENVIRONMENTAL MONITORING AND ASSESSMENT, 2007, 130 (1-3) : 141 - 147
  • [30] Development of Biaxial Tensile Test System for In-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis
    Kubo, Masahiro
    Yoshida, Hiroshi
    Uenishi, Akihiro
    Suzuki, Seiichi
    Nakazawa, Yoshiaki
    Hama, Takayuki
    Takuda, Hirohiko
    ISIJ INTERNATIONAL, 2016, 56 (04) : 669 - 677