VARIABILITY OF ULTRASONIC TRANSDUCERS.

被引:0
|
作者
Lidington, B.H.
Silk, M.G.
机构
来源
关键词
MATERIALS TESTING - Nondestructive Testing - STATISTICAL METHODS;
D O I
暂无
中图分类号
学科分类号
摘要
A statistical analysis of the variation in some of the important properties of ultrasonic probes is described. The probes evaluated by the NDT Centre's probe-beam plotter have been used as a sample. An attempt has been made to define acceptible limits to the variations in probe parameters, although these may not be of wide application since every application of ultrasonic testing defines slightly different limits of acceptability. It appears that 45% of low frequency probes and 81% of high frequency probes may lie outside these limits.
引用
收藏
页码:173 / 184
相关论文
共 50 条
  • [21] ULTRASONIC SYNTHETIC APERTURE FOCUSING USING PLANAR PULSE-ECHO TRANSDUCERS.
    Burch, S.F.
    Burton, J.T.
    1600, (22):
  • [22] ACCURACY OF WELDING CURRENT TRANSDUCERS.
    Stognii, B.S.
    Slyn'ko, V.M.
    Demin, A.E.
    Vainshtein, Yu.A.
    Burtsev, G.A.
    Measurement Techniques, 1985, 28 (07) : 657 - 660
  • [23] ULTRASONIC NONDESTRUCTIVE EVALUATIONS OF BUTT WELDS USING ELECTROMAGNETIC-ACOUSTIC TRANSDUCERS.
    Fortunko, C.M.
    Schramm, R.E.
    Welding Journal (Miami, Fla), 1982, 61 (02): : 39 - 46
  • [24] SECONDARY CONVERTERS FOR CAPACITATIVE TRANSDUCERS.
    Asanov, N.Kh.
    Measurement Techniques, 1985, 28 (04) : 327 - 330
  • [25] THICK FILM PRESSURE TRANSDUCERS.
    Di Flore, A.
    Haskard, M.R.
    Microelectronics Journal, 1986, 17 (01) : 35 - 41
  • [26] PARAMETRIC RESONANCE OF MAGNETOSTATIC TRANSDUCERS.
    Badashov, E.Ya.
    Prisekin, V.L.
    Measurement Techniques, 1987, 30 (01) : 100 - 104
  • [27] SELECTOR FOR THE CALIBRATION OF PIEZOELECTRIC TRANSDUCERS.
    Krivosheev, I.A.
    Baksheev, V.G.
    The Soviet journal of nondestructive testing, 1982, 18 (03): : 170 - 171
  • [28] High-Frequency Transducers.
    Kharitonov, P.T.
    Osadchii, E.P.
    1600,
  • [29] Calibration of Acoustic Emission Transducers.
    Dusek, Frantisek
    Schreppel, Ulrich
    Seidl, Ctibor
    Buchar, Jaroslav
    Kovove Materialy, 1980, 18 (02): : 259 - 270
  • [30] CMOS VOLTAGE TO CURRENT TRANSDUCERS.
    Torrance, R.R.
    Viswanathan, T.R.
    Hanson, J.V.
    IEEE transactions on circuits and systems, 1985, CAS-32 (11): : 1097 - 1104