Hot carrier dynamics near the Fermi edge of n-doped GaAs

被引:0
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作者
Fauchet, P.M. [1 ]
Kelly, P.J. [1 ]
Wicks, G.W. [1 ]
Young, J.F. [1 ]
Gong, T. [1 ]
机构
[1] Univ of Rochester, Rochester, United States
关键词
Doping (additives) - Dynamics - Electron energy levels - Electron scattering - Hot carriers - Solid state physics;
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摘要
Femtosecond bleaching measurement are performed in n-doped GaAs at both 300 K and 14 K using low densities of carriers injected at 2 eV. The dwell time of electrons excited far above the Fermi sea is reduced because of hot-electron/cold-electron interactions. The response at 14 K is much stronger and slower than that at 300 K. This is attributed to: (i) the proximity to the Fermi level of the conduction band states probed via split-off valence band coupling; (ii) slow Landau damping of non-equilibrium plasmons, primarily by the minority holes which then heat the majority electrons.
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页码:459 / 461
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