Nonscalability of alpha-particle-induced charge collection area

被引：0
|
作者：
Waseda Univ, Tokyo, Japan [1 ]
机构：
来源：
Jpn J Appl Phys Part 2 Letter | / 6 A卷 / L688-L690期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
7
引用
收藏
相关论文
共 50 条
  • [21] ALPHA-PARTICLE-INDUCED SOFT ERROR RATE MODELING
    SAIHALASZ, GA
    ISSCC DIGEST OF TECHNICAL PAPERS, 1982, 25 : 20 - 21
  • [22] ALPHA-PARTICLE-INDUCED SOFT ERRORS IN DYNAMIC MEMORIES
    MAY, TC
    WOODS, MH
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (01) : 2 - 9
  • [23] ALPHA-PARTICLE-INDUCED SOFT ERROR RATE IN VLSI CIRCUITS
    SAIHALASZ, GA
    WORDEMAN, MR
    DENNARD, RH
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (04) : 725 - 731
  • [24] Cross section measurement of alpha-particle-induced reactions on natSb
    Takacs, S.
    Ditroi, F.
    Szucs, Z.
    Brezovcsik, K.
    Haba, H.
    Komori, Y.
    Aikawa, M.
    Saito, M.
    Murata, T.
    Sakaguchi, M.
    Ukon, N.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2021, 505 : 24 - 33
  • [25] Genetic factors influencing alpha-particle-induced chromosomal instability
    Watson, GE
    Lorimore, SA
    Clutton, SM
    Kadhim, MA
    Wright, EG
    INTERNATIONAL JOURNAL OF RADIATION BIOLOGY, 1997, 71 (05) : 497 - 503
  • [26] Excitation functions for alpha-particle-induced reactions with natural antimony
    Singh, NL
    Shah, DJ
    Mukherjee, S
    Chintalapudi, SN
    NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA A-NUCLEI PARTICLES AND FIELDS, 1997, 110 (07): : 693 - 709
  • [27] Modeling of alpha-particle-induced soft error rate in DRAM
    Shin, HS
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (09) : 1850 - 1857
  • [28] ORIGIN AND CHARACTERISTICS OF ALPHA-PARTICLE-INDUCED PERMANENT JUNCTION LEAKAGE
    TAKEUCHI, K
    SHIMOHIGASHI, K
    KOZUKA, H
    TOYABE, T
    ITOH, K
    KUROSAWA, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (03) : 730 - 736
  • [29] Alpha-particle-induced upsets in advanced CMOS circuits and technology
    Heidel, David F.
    Rodbell, Kenneth P.
    Cannon, Ethan H.
    Cabral Jr., Cyril
    Gordon, Michael S.
    Oldiges, Phil
    Tang, Henry H.K.
    IBM Journal of Research and Development, 2008, 52 (03): : 225 - 231
  • [30] ANALYSIS OF ALPHA-PARTICLE-INDUCED SOFT ERRORS IN STATIC RAM
    KUNIEDA, S
    ANDO, M
    TSUJIDE, T
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (11) : 2183 - 2184
12345