IMPROVED PROFILE EPITAXIAL TECHNIQUE FOR ELECTRON SHIELDING.

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Saretto, S.

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IBM technical disclosure bulletin | 1984年 / 27卷 / 4 A期

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页码：2271 / 2273

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[30] EFFECT OF THE QUALITY OF GAS SHIELDING ON THE PROCESS OF CO2 WELDING AND DETECTION OF DISRUPTIONS IN SHIELDING.
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