Automatic solder joint inspection system by X-ray imaging

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作者
Hamada, Toshimitsu
Nakahata, Kozo
Fushimi, Satoru
Morioka, Yoshifumi
Nishida, Takehiko
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Clustering procedure - Fillet judgement - Logarithmic transformation - Multistep thresholding - Pattern frequency distribution - X ray imaging;
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页码:65 / 71
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