Atomic force microscopy study of small-size nanotubular polymer thin films

被引:0
|
作者
Chinese Acad of Sciences, Beijing, China [1 ]
机构
来源
J Mater Res | / 3卷 / 1084-1090期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Atomic force microscopy study of small-size nanotubular polymer thin films
    Zhu, CF
    Lee, I
    Li, JW
    Wang, C
    Cao, XY
    Xu, H
    Zhang, RB
    JOURNAL OF MATERIALS RESEARCH, 1999, 14 (03) : 1084 - 1090
  • [2] Atomic force microscopy study of small-size nanotubular polymer thin films
    C. F. Zhu
    I. Lee
    J. W. Li
    C. Wang
    X. Y. Cao
    H. Xu
    R. B. Zhang
    Journal of Materials Research, 1999, 14 : 1084 - 1090
  • [3] Thermal induced instability of thin polymer films: A study by atomic force microscopy
    Gan, DJ
    Cao, WJ
    Puat, NE
    HIGH PERFORMANCE POLYMERS, 2001, 13 (04) : 259 - 267
  • [4] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF THIN POLYMER-FILMS
    MIZES, HA
    LOH, KG
    MILLER, RJD
    CONWELL, EM
    ARBUCKLE, GA
    THEOPHILOU, N
    MACDIARMID, AG
    HSIEH, BR
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1991, 194 : 305 - 310
  • [5] Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy
    Du, BY
    Tsui, OKC
    Zhang, QL
    He, TB
    LANGMUIR, 2001, 17 (11) : 3286 - 3291
  • [6] Electron Transport in Thin Films of Polymer and Small-Molecule Acceptors Visualized by Conductive Atomic Force Microscopy
    Hidayat, Anjar Taufik
    Benten, Hiroaki
    Kawanishi, Toshiki
    Ohta, Noboru
    Muraoka, Azusa
    Nakamura, Masakazu
    JOURNAL OF PHYSICAL CHEMISTRY C, 2021, 125 (25): : 13741 - 13748
  • [7] ATOMIC-FORCE MICROSCOPY STUDY OF THE MICROROUGHNESS OF SIC THIN FILMS
    BLOUIN, M
    GUAY, D
    ELKHAKANI, MA
    CHAKER, M
    BOILY, S
    JEAN, A
    THIN SOLID FILMS, 1994, 249 (01) : 38 - 43
  • [8] Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
    Franta, D
    Ohlídal, I
    Klapetek, P
    Nepustilová, R
    Bajer, S
    SURFACE AND INTERFACE ANALYSIS, 2006, 38 (04) : 842 - 846
  • [9] Thin liquid films studied by atomic force microscopy
    Bonaccurso, Elmar
    Kappl, Michael
    Butt, Hans-Juergen
    CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 2008, 13 (03) : 107 - 119
  • [10] Atomic and Kelvin probe force microscopy of thin films
    Alessandrini, A
    Valdrè, U
    PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 553 - 554