共 50 条
- [4] Surface structural analysis by scanning probe microscopy 1600, Sumitomo Metal Industries Ltd, Osaka, Japan (47):
- [5] A multi-technique approach for characterizing the SVN49 signal anomaly, part 2: chip shape analysis GPS Solutions, 2012, 16 : 29 - 39
- [8] Nanotechnology and surface analysis using scanning probe microscopy SIEMENS REVIEW, 1996, : 2 - 4
- [10] Advanced backside sample preparation for multi-technique surface analysis EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2011, 55 (03):