Manufacturing and testing on large aspherical surface

被引：0
|
作者：
Zhang, Q. [1 ]
Zhang, P.Y. [1 ]
Hao, P.M. [1 ]
Kong, X.L. [1 ]
Ding, H.Y. [1 ]
Lin, L. [1 ]
机构：
[1] Dept. of Astronomy and Applied Phys., Univ. of Sci. and Technol. of China, Hefei 230052, China
来源：
Guangxue Jishu/Optical Technique | 2001年 / 27卷 / 03期
关键词：
Error compensation - Manufacture - Precision engineering - Surfaces - Testing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The manufacture and test of large-scale asphere usually use Offner compensation system. Offner compensation system is discussed. A small-scale Offner compensation system with three-lens is used to test large-scale aspherical surface. This system has two virtues that adjusting and testing are convenient and precision of manufacture is high. This method is confirmed in practice. A good experimental result is obtained by manufacturing target-scale asphere (Φ 630 mm) with the method proposed.
引用
收藏
页码：204 / 205
相关论文
共 50 条
  • [21] TESTING OF ASPHERICAL SURFACES ON A GONIOMETER
    LEUSHINA, TM
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1978, 45 (09): : 544 - 547
  • [22] METHODS OF TESTING ASPHERICAL SURFACES
    CHUNIN, BA
    SHISHLOV, EA
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1990, 57 (11): : 680 - 683
  • [23] TECHNIQUE FOR TESTING ASPHERICAL SURFACES
    STULLER, G
    MEASUREMENT TECHNIQUES, 1981, 24 (01) : 3 - 7
  • [24] Eyepiece of aspherical surface
    Anhui Inst of Optical & Fine, Mechanics, Chinese Acad of Science, Hefei, China
    Guangxue Xuebao, 10 (1389-1393):
  • [25] Testing of rectangle aperture off-axis aspherical mirror in process of numerical control manufacturing
    Zhang, Feng
    Pan, Shou-Fu
    Zhang, Xue-Jun
    Wang, Quan-Dou
    Zhang, Zhong-Yu
    Guangxue Jishu/Optical Technique, 2002, 28 (04): : 289 - 290
  • [26] ASPHERICAL SURFACE TESTING WITH SHEARING INTERFEROMETER USING FRINGE SCANNING DETECTION METHOD
    YATAGAI, T
    KANOU, T
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 429 : 136 - 141
  • [27] ASPHERICAL SURFACE TESTING WITH SHEARING INTERFEROMETER USING FRINGE SCANNING DETECTION METHOD
    YATAGAI, T
    KANOU, T
    OPTICAL ENGINEERING, 1984, 23 (04) : 357 - 360
  • [28] Manufacturing and testing of a cubic SiC surface
    闫锋
    范镝
    张斌智
    殷龙海
    李锐刚
    张学军
    Chinese Optics Letters, 2009, 7 (06) : 534 - 536
  • [29] Manufacturing and testing of a cubic SiC surface
    Yan, Feng
    Fan, Di
    Zhang, Binzhi
    Yin, Longhai
    Li, Ruigang
    Zhang, Xuejun
    CHINESE OPTICS LETTERS, 2009, 7 (06) : 534 - 536
  • [30] Manufacturing of high precision aspherical and freeform optics
    Hoogstrate, Andre M.
    van Drunen, Casper
    van Venrooy, Bart
    Henselmans, Rens
    MODERN TECHNOLOGIES IN SPACE-AND GROUND-BASED TELESCOPES AND INSTRUMENTATION II, 2012, 8450
12345