Set-up for Investigations of Creep and Long-Term Strength of Film Materials at Low Temperatures.

The installation and methods for investigating creep and recovery of composition films subject to impulse loadings at low temperatures are described. A special feature of the set-up is the use of semiconductor thermoelectric batteries to cool the working volume of its chamber. Appropriate arrangements and devices with semiconductor sensors included in the set-up permit considerable improvement of the accuracy of the measurement of forces and deformations, compared with the existing methods. Typical creep and recovery diagrams are given for static and subsequent impulse loading.