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- [1] THERMAL-STABILITY AND RADIATION-STABILITY OF HYDROGEN-IMPLANTED SILICON STANDARDS FOR ION-BEAM ANALYSIS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 5 (03): : 505 - 510
- [2] Temperature Dependence of Defects in Hydrogen-Implanted Silicon Characterized by Positron and Ion-Beam Analyses POSITRON STUDIES OF DEFECTS 2011, 2012, 35 : 151 - 156
- [3] Positron and ion-beam analyses of hydrogen-implanted Si: Characterization of vacancy- and interstitial-type defects REPORT OF RESEARCH CENTER OF ION BEAM TECHNOLOGY, HOSEI UNIVERSITY, 2009, (27): : 29 - 32
- [4] APPLICATION OF BULK HYDROGEN STANDARDS TO THE CALIBRATION OF ION-BEAM SURFACE-ANALYSIS NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (03): : 573 - 576
- [6] Investigation of thermal recovery behavior in hydrogen-implanted SrTiO3 using high energy ion beam techniques NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 544 - 548
- [7] Thermal solid phase epitaxial growth and ion-beam induced crystallisation of Ge+ ion implanted layers in silicon NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 120 (1-4): : 207 - 211
- [8] ION-BEAM ANALYSIS OF THE CONCENTRATION AND THERMAL RELEASE OF HYDROGEN IN SILICON-NITRIDE FILMS PREPARED BY ECR PLASMA CVD METHOD JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (08): : 1406 - 1410
- [9] HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ION-BEAM INDUCED ANNEALING OF MEV AS+ ION-IMPLANTED SILICON NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 434 - 438
- [10] The unique role of ion beam analysis in modeling the thermal evolution of hydrogen in Si implanted at doses required for ion cutting NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 219 : 788 - 791