Electromechanical properties of lead-based ferroelectric thin films

被引：0
|
作者：
Kholkin, A.L. [1 ]
Brooks, K.G. [2 ]
Taylor, D.V. [3 ]
Setter, N. [3 ]
Safari, A. [1 ]
机构：
[1] Dept. of Ceramics and Materials Eng., Rutgers University, Piscataway, NJ 08854, United States
[2] Laboratory of Polymers and Interfaces, Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland
[3] Ceramics Laboratory, Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland
来源：
Materials Research Society Symposium - Proceedings | 1999年 / 541卷
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页码：623 / 628
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